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Active: In Production.


The DS2174 enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2n - 1, where n can take on values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.

Data Sheet

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Key Features

  • Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems
  • Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 232 - 1; up to 32 taps can be used in the feedback path
  • Programmable, user-defined pattern registers for long repetitive patterns up to 512 bytes in length
  • Large 48-bit count and bit error count registers
  • Software-programmable bit error insertion
  • Fully independent transmit and receive paths
  • 8-bit parallel-control port
  • Detects polynomial test patterns in the presence of bit error rates up to 10-2
  • Programmable for serial, 4-bit parallel, or 8-bit parallel data interfaces
  • Serial mode clock rate is 155MHz; byte mode is 80MHz for a net 622Mbps; OC-3
  • Available in 44-pin PLCC

Key Specifications:

T/E Carrier & Packetized Products
Part Number Transmission Standard Functions Channels VSUPPLY
See Notes
DS2174  T1/E1/J1 Bit Error-Rate Tester 1 3.3 $18.95 @1k
See All T/E Carrier & Packetized Products (88)

Pricing Notes:

This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.


DS2174: Block Diagram
Block Diagram

More Information

New Product Press Release   2002-05-13 ]

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Rev 1; 2002-09-13
This page last modified: 2010-01-11